You are here

Publications

Primary tabs

  1. L. Gonzo; L. Calliari; F. Marchetti,
    Boron valence states in the Fe-B system: an Auger line-shape investigation,
    in «VUOTO»,
    vol. 20,
    n. 2,
    , pp. 341 -
    344
  2. L. Calliari; F. Marchetti; M. Sancrotti; O. Bisi; A. Iandelli; G. L. Olcese; A. Palenzona,
    Silicon valence states in calcium silicides: A Si L2,3VV Auger line-shape analysis,
    in «PHYSICAL REVIEW. B, CONDENSED MATTER»,
    vol. 41,
    n. 11,
    , pp. 7569 -
    7575
  3. G.F. Cerofolini; L. Meda; G. Ottaviani; J. DeFayette; R. Dierckx; D. Donelli; M. Orlandini; Mariano Anderle; Roberto Canteri; C.L. Claeys; J. Vanhellemont; C. Volpones,
    Structure and Evolution of the Displacement Field in Hydrogen-Implanted Silicon,
    in «PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS»,
    vol. 41,
    , pp. 12607 -
    12618
  4. C. Bresolin; C. Zaccherini; Mariano Anderle; Roberto Canteri,
    A Comparison between Zero and Seven Degree of Tilt Implantation of As+, P+ and BF2+,
    in «NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS»,
    vol. 51,
    , pp. 122 -
    124
  5. Lorenzo Fedrizzi; Y. Massiani; J. Crousier; Maurizio Dapor; P. Bonora,
    Electrochemical characterization of magnetron sputter-deposited Nb-Zr thin metal films,
    in «CORROSION»,
    vol. 46,
    , pp. 499 -
    505
  6. Giovanni Soncini; G. B. Tripodi; Mario Zen; Nicola Zorzi,
    in «MICROELECTRONICS JOURNAL»,
    vol. 21,
    n. 1,
    , pp. 23 -
    28
  7. Maurizio Dapor,
    Backscattering of electrons from solid targets,
    in «PHYSICS LETTERS A»,
    vol. 151,
    , pp. 84 -
    89
  8. A. Paccagnella; L. Wang; C. Canali; G. Castellaneta; Maurizio Dapor; G. Donzelli; E. Zanoni; S. Lau,
    Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance,
    in «THIN SOLID FILMS»,
    vol. 187,
    , pp. 9 -
    18
  9. S. Vidwans; Arun Narsale; V. Salvi; A. Rangwala; Luis Guzman; Fabio Marchetti; Maurizio Dapor; Lucia Calliari,
    Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation,
    in «RADIATION EFFECTS AND DEFECTS IN SOLIDS»,
    vol. 114,
    , pp. 93 -
    97
  10. Fabio Marchetti; Maurizio Dapor; Stefano Girardi; M. Cipparrone; P. Tiscione,
    Auger quantitative analysis and preferential sputtering in brass alloys,
    in «VACUUM»,
    vol. 41,
    , pp. 1706 -
    1709