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Publications

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  1. S. Janikowska,
    Studio del tempo di permanenza nel circolo sanguigno e della biodistribuzione di liposomi sensibili,
    , pp. 13 -
    15
  2. J.-M. Bonard; J.-D. Garniere; Lia Emanuela Vanzetti; J.J. Paggel; L. Sorba; A. Franciosi; D. Hervé; E. Molva,
    Combined Transmission Electron Microscopy and Cathodoluminecence Studies of Degradation in Electron-Beam-Pumped Zn1-Xcdxse/Znse Blue-Green Lasers,
  3. Nadhira Bensaada Laidani; C. Dorigoni; Antonio Miotello; Lucia Calliari; G. Scarel; M. Sancrotti,
    Depth-Profiling Via X-Ray Photoemission and Auger Spectroscopies of N+ Implanted Tungsten Carbides Grown on the Ti-6Al-4V Alloy,
    in «THIN SOLID FILMS»,
    vol. 317,
    , pp. 477 -
    480
  4. Nadhira Bensaada Laidani; Lucia Calliari; Giorgio Speranza; Victor Micheli; E. Galvanetto,
    Mechanical and Structural properties of Ni-C Films Obtained by R.F. Sputtering,
    in «SURFACE & COATINGS TECHNOLOGY»,
    vol. 100-101,
    , pp. 116 -
    124
  5. C. Dorigoni; Nadhira Bensaada Laidani; Antonio Miotello; Lucia Calliari,
    Ar+-Implantation Effects on the Interfacial Properties of the WC/TI-6Al-4V System,
    in «SURFACE & COATINGS TECHNOLOGY»,
    vol. 100-101,
    , pp. 358 -
    361
  6. Lucia Calliari; Nadhira Bensaada Laidani; Giorgio Speranza,
    X-Ray and UV Valence Band Photoemission of Carbon Films,
    in «SURFACE AND INTERFACE ANALYSIS»,
    vol. 26,
    , pp. 565 -
    568
  7. Nadhira Bensaada Laidani; Giorgio Speranza; Alexey Nefedov; Lucia Calliari; Mariano Anderle,
    Characterization of Carbon and Zirconia Films Deposited on Polycarbonate for Scratch-Proof Coating Applications,
    in «DIAMOND AND RELATED MATERIALS»,
    vol. 7,
  8. S. Pizzini; M. Donghi; S. Binetti; G. Wagner; Massimo Bersani,
    Luminescence from Erbium-Doped Silicon Epi Layers Grown by Liquid-Phase Epitaxy,
  9. S. Imovilli; B. Morten; M. Prudenziati; A. Gualtieri; Massimo Bersani,
    Interactions between bismuth oxide and ceramic substrates for thick film technology,
  10. Massimo Bersani; Lia Emanuela Vanzetti; M. Sbetti; Mariano Anderle,
    Characterisation of RTA Oxynitrides by SIMS and XPS Analyses,