1. Diego Bisero; Maurizio Dapor; Benno Margesin,
    X-ray diffraction study of P-doped polycrystalline Si thin films used in ULSI devices,
    in «MATERIALS LETTERS»,
    vol. 14,
    1992
    , pp. 303 -
    306
  2. Maurizio Dapor; Guido Cicolini; Flavio Giacomozzi; Maurizio Boscardin; G. Queirolo,
    Seeman-Bohlin x-ray diffraction study of Al-1%Si thin films used in ULSI devices,
    in «MATERIALS LETTERS»,
    vol. 13,
    1992
    , pp. 142 -
    146
  3. Y. Massiani; P. Gravier; J. Crousier; Lorenzo Fedrizzi; Maurizio Dapor; Victor Micheli; L. Roux,
    Effects of ion beam implantation on the corrosion behaviour of TiN-coated Ti-6Al-4V alloy,
    in «SURFACE & COATINGS TECHNOLOGY»,
    vol. 52,
    1992
    , pp. 159 -
    167
  4. Maurizio Dapor,
    Monte Carlo simulation of backscattered electrons and energy from thick targets and surface films,
    in «PHYSICAL REVIEW. B, CONDENSED MATTER»,
    vol. 46,
    1992
    , pp. 618 -
    625
  5. Maurizio Dapor,
    Theory of the interaction between an electron beam and a thin solid film,
    in «SURFACE SCIENCE»,
    vol. 269/270,
    1992
    , pp. 753 -
    762
  6. Fausto Giunchiglia; C. Ferrari; Paolo Traverso; E. Trucco,
    Understanding scene descriptions by integrating different sources of knowledge,
    in «INTERNATIONAL JOURNAL OF HUMAN-COMPUTER STUDIES»,
    vol. 37,
    1992
    , pp. 47 -
    81
  7. L. Moro; Roberto Canteri; A. Anderle,
    Sputtered netural and molecular ion mass spectrometries in the characterization of multilayer samples,
    in «SURFACE AND INTERFACE ANALYSIS»,
    vol. 18,
    n. 11,
    1992
    , pp. 765 -
    772
  8. G. F., Cerofolini; L., Meda; R., Balboni; F., Corni; S., Frabboni; G., Ottaviani; Rita, Tonini; Anderle, Mariano; Canteri, Roberto,
    Hydrogen- related complexes as the Stressing Species in High-Fluence, Hydrogen-Implanted, Single Crystal Silicon,
    in «PHYSICAL REVIEW. B, CONDENSED MATTER»,
    vol. 46,
    n. 4,
    1992
    , pp. 2061 -
    2070
  9. A. Molinari; G. Straffelini; V. Fontanari; Roberto Canteri,
    Sintering and Microstructure of Phosphorus Steels,
    in «POWDER METALLURGY»,
    vol. 35,
    n. 4,
    1992
    , pp. 285 -
    292
  10. S.P. Jeng; T. Ma; Mariano Anderle; Gary Wayne Rubloff; Roberto Canteri,
    Anomalous Diffusion of Fluorine in Silicon,
    in «APPLIED PHYSICS LETTERS»,
    vol. 61,
    n. 11,
    1992
    , pp. 1310 -
    1312

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